Aberration Corrected TEM at the INA: new capabilities and first results
Congress:
Transmission Electron Microscopy, Advanced Applications for Materials Science and Nanotechnology
Participation type:
Póster
Other authors:
C. Magén
Year:
2010
Location:
Bellaterra, Barcelona, Spain
Publication:
C. Magén. Aberration Corrected TEM at the INA: new capabilities and first results . En: Transmission Electron Microscopy, Advanced Applications for Materials Science and Nanotechnology. Bellaterra, Barcelona, Spain: , 2010