Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS

Alberto Eljarrat, Lluís López-Conesa, Julian López-Vidrier, Sergi Hernández, Blas Garrido, César Magén, Francesca Peiró, Sònia Estradé. Nanoscale 5, 14971-14983, (2014).