Development of a diagnosis tool based on the measurement of molecular interactions using CMOS-integrated piezoresistive microcantilevers
Congreso:
International Workshop on Nanomechanical Sensors
Tipo de participación:
Comunicación oral
Otros autores:
J. Bausells, G. Villanueva, F. Pérez-Murano, C. Vancura, J. Lichtenberg, T. Volden, Y. Li, M. Zimmermann, WH.Song, KU. Kirstein, A. Hierlemann, L. McDonnell, C. O’Farrell, A. Grant, EM. Gil-Romero, J. O’Mullane, M. Crowley, A. Sheehan, A. Gil, A.I Gracia-Lostao, J. Sotres
Año :
2006
Lugar:
Copenhague (Dinamarca)
Publicación (cita):
J. Bausells, G. Villanueva, F. Pérez-Murano, C. Vancura, J. Lichtenberg, T. Volden, Y. Li, M. Zimmermann, WH.Song, KU. Kirstein, A. Hierlemann, L. McDonnell, C. O’Farrell, A. Grant, EM. Gil-Romero, J. O’Mullane, M. Crowley, A. Sheehan, A. Gil, A.I Gracia-Lostao, J. Sotres. Development of a diagnosis tool based on the measurement of molecular interactions using CMOS-integrated piezoresistive microcantilevers. En: International Workshop on Nanomechanical Sensors. Copenhague (Dinamarca): Proceedings of the International Workshop on Nanomechanical Sensors, 2006