Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS

Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS. Alberto Eljarrat, Lluís López-Conesa, Julian López-Vidrier, Sergi Hernández, Blas Garrido, César Magén, Francesca Peiró, Sònia Estradé. Phys. Chem. Chem. Phys. 18, 23264-23276 (2016).