Previous
Pause
Siguiente
Skip to Navigation
↓
Low-Loss EELS Investigations on Atomically Thin MoxW(1-x)S2 Nanoflakes for Delving into Their Optoelectronic Properties
M. Pelaez-Fernandez, Y.C. Lin, K. Suenaga, R. Arenal* Microscopy and Microanalysis 24, 1576 (2018).
