Polarity assignment in ZnTe, GaAs, ZnO and GaN-AlN nanowires from direct dumbbell analysis by means of aberration corrected HAADF and ABF STEM
Congreso:
15th European Microscopy Congress, EMC'2012
Tipo de participación:
Ponencia plenaria e invitada
Otros autores:
M. de la Mata, J. Gazquez, C. Magen, M. I. B. Utama, M. Heiss, B. Peng, J. R. Morante, M. Eickhoff, A. Fontcuberta i Morral, Q. Xiong, J. Arbiol
Año :
2012
Lugar:
Manchester, UK
Publicación (cita):
M. de la Mata, J. Gazquez, C. Magen, M. I. B. Utama, M. Heiss, B. Peng, J. R. Morante, M. Eickhoff, A. Fontcuberta i Morral, Q. Xiong, J. Arbiol. Polarity assignment in ZnTe, GaAs, ZnO and GaN-AlN nanowires from direct dumbbell analysis by means of aberration corrected HAADF and ABF STEM . En: 15th European Microscopy Congress, EMC'2012. Manchester, UK: , 2012